24November2017

Materials and Electronics Engineering



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1. Studying the chemical composition and structure of hafnium, aluminium and lanthanum oxide films by X-ray photoelectron spectroscopy Zhongli Li, Yijian Liu, Huijuan Geng, AyraJagadhamma Letha, Limin Sun, Ying Wang, Huey-Liang Hwang, Fedor A. Kyznetsov, Tamara P. Smirnova, Andrey A. Saraev, Vasily V. Kaichev Materials and Electronics Engineering 2015, 2 (2), 2-